Archive for August 2006
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Don’t Forget the Basics
In today’s 65nm and beyond world, DFT’ers are stretching their wings and flying into the land of new technologies such as test compression, at-speed scan, and newer fault models such as bridging faults. And it’s completely necessary. But don’t forget that no matter how you plan to trap more and different types of [...]
Testing Non-scan, Custom Digital Blocks
If I had to express the holy grail for testability, it would be “automated coverage”. The most desirable kind of manufacturing test has been automatically generated by tools that leverage design elements and modes to make test time and resource efficient. Of course, I’m talking scan, BIST, and extensions thereof.
But no matter what you [...]
So, yes, I would like to keep this up…
It’s been quite awhile since I’ve posted here. But I do think this blog is a worthwhile effort, since, in the long run, maybe I can share some experience, and get other people to share their experiences.
So look for more posts to come on several subjects like At-speed scan, Test Compression and BIST!
