DFT Digest

You are browsing the archives of 2006 September.

… here are a couple of interviews from Test & Measurement World,
ITC Tutorials Span DFT Basics to RF Test, with Rob Aitken of ARM,
and an earlier one,
ITC To Address Expanding Test Role, with Anne Gattiker, Program Chair

Saw this in EETimes online yesterday…
Synopsys claims tripling of TetraMAX ATPG tool performance
DFT Digest is not a news blog, in general, but that’s probably good, because DFT news doesn’t happen quite often enough to blog it. But I’m guessing that this coming month, with ITC week coming, there’ll be some coverage I can pass [...]

Shocking…
Math Teacher Arested
NEW YORK — A public school teacher was arrested today at John F. Kennedy International Airport as he attempted to board a flight while in possession of a ruler, a protractor, a set square, a slide rule and a calculator.
At a morning press conference, Attorney General Alberto Gonzales said he believes the man [...]

I’ve run across a couple of items in my reading lately about concerns with test-mode power. Not that it’s a new issue, but sometimes when you’re looking for something else, a subject will jump out you a couple of times, causing you to take notice.
Much has been studied and written about test-mode power consumption in [...]

When I last left off in this series, we were talking about the broadcasting of scan data from a few external scan chains across many internal parallel scan chains, and some of the ways it is implemented. Not too much detail, but enough to present the concept. So far, all high-level DFT.
Well, once the [...]