Archive for February 2007

You are browsing the archives of 2007 February.

The Top 10 Rules of Scan Design

I don’t know if I ever mentioned it before, but a DFT blog was not my original objective for creating an IC design oriented website. In truth, a couple of buddies and I had visions of [...]

Other pages on this blog… Chock full of DFT info!

Over there on the right hand side of this page, you’ll see a section called ‘pages’. Underneath, I’ve added two links recently, one called ‘DFT Calendar, and another called DFT Bookcase.
The calendar has a small list of design for test related links to conferences and such.
The bookcase has the entire list of books that [...]

WGL, STIL, CTL – The Evolving Languages of DFT

If you’ve ever been involved with device test or design for test, you’re very likely familiar with at least one of these acronyms – most probably WGL (Waveform Generation Language). If you’ve been in practice in the last 10 years, you’ve at least heard of STIL (Standard Test Interface Language).
How much do you know [...]

Design-With-Test… 2nd sighting

Another article, this by Sanjiv Teneja of Cadence Design Systems, promoting DWT, or “Design-With-Test” has been posted over at Test & Measurement, as a guest commentary. I blogged a few weeks ago about a similar article by another marketing man from the same company. I smell a conspiracy! Just kidding, go [...]

T.W. Williams Wins Lifetime Achievement Award (part deux)

Wow, I shouldn’t be tootin’ my own horn here since I blindly tripped upon the news myself, but today, after over a month since it was reported here, Synopsys released the announcement about Tom Williams winning the EDAA Lifetime Achievement award.
I’m sure there was no hurry to announce it, since the award won’t be given [...]