Archive for April 2007
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Design for Test Pros: Who do you work for?
Design for Test is a funny job – it’s like straddling the wall that, in previous generations, designers would throw their designs over to the test guys to write tests…
Traditionally, designers belong to a design group, of course, and test engineers belong to the operations arm of an organization. Both of these roles have [...]
Problems? What Problems? Design for Test in the
OK, settle down, I know there’s gonna be problems. And to be sure, there are many out there that have already begun to encounter them. Oh, yeah, and then there’s 45nm – I just read today that both Intel and IBM have demonstrated 45nm designs. The article linked is pretty fascinating – [...]
Please come to Austin for the Springtime…
And while you’re there, make sure to attend the 2007 SouthWest DFT Conference, hosted by SiliconAid, a DFT consulting services group, based in Austin, TX. This is the 4th year of the annual event, and it features a day-long tutorial, followed by a free technical day, featuring a keynote address, and three technical sessions.
I [...]
Today is the first day of DATE – Are you there?
The DATE (Design Automation and Test in Europe) conference starts today in Nice, France (beautiful place – I have had the fortune of delivering a paper there, for a different conference, several years ago).
If you read this blog, and you are there, check in and give us some updates on what’s interesting!
The keynotes will be [...]
So Much Design for Test… So Little Time
So after getting through crunch time at work, I took my family on a short vacation up to the Pacific Northwest. What a beautiful place. Yeah, it rains a lot. But it makes for lots of pretty green stuff… But now it’s crunch time to pay for that week off.
So, while I [...]
