Archive for December 2007
You are browsing the archives of 2007 December.
You are browsing the archives of 2007 December.
I know, education is always good, but just how much effort should we as DFT Engineers put into educating designers about the whys and wherefores of design-for-test? Do your pleas for test access/features either turn into an endless negotiation, or fall on deaf ears altogether? Of course, test education for engineers and managers is [...]
Check out this top 10 list (h/t Maggies Farm) from the acknowledged creator of the term ‘weblogs’, Jorn Barger – indispensible advice for new bloggers (which I’m sure applies to all bloggers). Interestingly enough, his concept of a blog lines up more with a site like del.icio.us than with any of the most popular [...]
An ‘advisory’ group that is… somehow DFT religion must be brought to upper management.
Introducing the Testability Management Advisory Group (TMAG), “a grass roots organization made up of test professionals who believe that success for Testability in general, and Design for Testability (DFT) in particular, requires the involvement of management at all levels.”
The first official [...]
Two items from the news this past week (presumably timed to coincide with Semicon Japan):
First, it was announced Tuesday that Asset Intertech, who provides boundary scan solutions, acquired Intertest Tech (ITT), an Irish supplier of process emulation technology. This seems to be a cementing of the strategic relationship they’ve had for the past three years, [...]
It still amazes me just how long DFT has been around. I suppose that time passes quicker than you think; turn around, and fifteen years have passed. It was about that long ago when I had my first exposure to scan and ATPG. And to me – it was brand new technology. [...]