Archive for April 2008
You are browsing the archives of 2008 April.
Mixed-Signal DFT is Loopy
In the past there have been requests to address analog/Mixed-signal Design for Test on this blog. I’ve tried to incite discussion on the subject a couple of times in previous posts (here and here) – limp efforts, [...]
How do you define DFT?
What is DFT? Many designers just say it’s a pain in the ass. But TMAG has a more accurate description in mind. And they’d like to know if you agree. I blogged a few days ago about the 4/1 general meeting of TMAG (Testability Management Action Group). Well, the ‘Beyond DFT’ [...]
Southwest DFT Conference Approaching – Sign up now!
Registration is open for the Southwest DFT conference, held this time each year in Austin, TX – hosted by SiliconAid Solutions, and sponsored by Cadence, Mentor and Synopsys. Registration is on a first come, first serve basis, so sign up while there’s room!
The conference is a 2-day event, consisting of a day of tutorials, and [...]
DAtE – a very small ‘t’, if you read the trade press…
May I be the first to call for the removal of the ‘T’ in DATE (Design Automation & Test in Europe)? If you read the trade press, there was no Test there! DATE 2008 came and [...]
