Archive for June 2008
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You are browsing the archives of 2008 June.
Check out the press release here.
I encourage all of you interested in this form of communication to come and participate!
Just a couple of posts ago, I was pointing out that I’d like to be able to attend conference technical sessions in an a-la-carte fashion, since DFT is one of those disciplines that, with a few exceptions, is covered very lightly at many conferences. Why pay full price for just a couple presentations?
One commenter, [...]
I sometimes wonder this.
It seems in the past several years, the design-for-test job has grown more complicated (as any other facet of the electronics design discipline), what with new (or more prominent) defect mechanisms and fault models, and new DFT methods and technologies to address them.
I was reading an interview at T&M World with Atun [...]