DFT Digest

I mentioned in my previous post the fact that the design-for-test content was pretty much ITC warmed over. I’m not surprised, mind you. DAC really is more for the overall design & EDA community, whereas the focus of ITC is test. But I saw this article over at the Test & Measurement website that sort of underscores my point.

Four general areas of DFT (or DFM) technology were highlighted in the article. The first area, in my mind, really is a DFM offering. Volume diagnostics or defect diagnostics are terms for tools that most of the big vendors are developing to apply test data back to the layout.

The second, third and fourth areas mentioned are DFT technologies that have been developing over the last 1-2 years, namely, power aware DFT, ATPG for small delay defects, and test compression, all of which I’ve blogged about here at DFT Digest at some point.

Perhaps now would be a good time to cycle though them with some small posts summarizing the offerings from various DFT vendors…

I’ll do that in the coming days…