DFT Digest

Dear reader: just think about how far test and design-for-test technology has come since you’ve been in the industry – even if only for a few years, new problems have arisen, and new techniques and tools have appeared to solve them (not all of them, but…).

This happens because a legion of engineers and researchers bring their expertise to bear on the problems, and in turn, contribute their solutions to the community.

The following Google Alert landed in the in-box today: Four University of Texas profs promoted to IEEE Fellow status. One of them was Dr. Nur Touba, who you may recognize most recently as the as Program Chair for ITC 2008.  He was recognized “for contributions to data compression and built-in self-test for integrated circuits“.

I imagine being promoted to IEEE Fellow is a big deal, and I’m always interested when a test or DFT professional is part of the list.  I blogged it last year as well.  So I went to the IEEE website to find out who else had been included this year.  Click here to download the full list, but here’s who else  I found:

• Ronald DeShawn Blanton, for contributions to testing of microelectromechanical systems and integrated circuits,
• Kenneth M. Butler – for contributions to testing of digital integrated circuits,
• Fabrizio Lombardi – for contributions to testing and fault tolerance of digital systems,
• José Pineda de Gyvez – for contributions defect oriented testing of integrated circuits,
• Hans-Joachim Wunderlich – for contributions to very-large-scale-integration circuit testing and fault tolerance,

Congratulations to all of you, and thank you for your work!