DFT Digest

Today’s International Test Conference promises a full day of technical paper presentations, a lecture series, five panel discussions and at the end of the day, because you really should be exhausted after all that - the Wine and Cheese reception.

Today’s topics include test power issues, ATPG and delay test, functional and outlier test, advances in SOPC test, boundary scan, and wafer probing. A cornucopia of interesting topics.

Al Crouch will be giving the invited address at 1:15PM, called The Need for Standard and Efficient Interconnection and Access of Embedded-everything, targeted toward his work on the embedded JTAG initiative called IJTAG (IEEE P1687). I seriously hate to be missing this.

I missed a couple of items about yesterday - first, Ben Bennetts gave his invited address, a DFT retrospective. I’ll be anxious to see how that went. Also, the Magma lunch was yesterday - they rolled out their new ATPG products, and had invited Dr. Mohammad Tehranipoor to give a talk. If anybody reading out there attended these, drop me a message, and tell me what you thought!