DFT Digest

October is here, and that means the International Test Conference will be back in town (Santa Clara, CA, that is), with the theme of “Facing Nanometer-technology Test Challenges”. Remember when the challenge was merely deep sub-micron?

The time and place are similar to last year: Santa Clara Convention Center, October 21-26. Tutorials will be held on the 21st and 22nd (Sun-Mon), workshops on the 25th and 26th (Thu-Fri), with the conference and technical paper sessions being held the 22nd through the 25th (Tue-Thu).

Head over to the conference website and download a program. Then let me know what you’re most interested in, and whether you’re going to be attending (unfortunately, there’s no free day as is the tradition of DAC).

I can’t attend this year, due to scheduling problems (and I don’t live in the area, so it’s a bigger challenge to get away during busy times), but would like to enlist as many of you readers as possible to be my eyes and ears - let me know what you saw, and we’ll get it out to the rest of the DFT community!

Thanks - and let me know…

John