DFT Digest

Wow, it’s been so long since I done “in-the-news”, this might get to be a long post… the DFT world moves on whether I have time to document it or not!

The following are a selection of press releases from the first quarter of this year; I’ll follow up with more DFT in-the-news – beacause there is more to the industry than press releases!

Intellitech unveils low-power Bluetooth based IEEE 1149.1/JTAG Pod with non-volatile test and failure memory

Santa Clara, California – International Test Conference – October 30th, 2008 – Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE 1149.1/JTAG, has announced UltraTAP-BT, a Bluetooth enabled IEEE 1149.1/JTAG pod with non-volatile test program and failure memory.

Corelis joins Texas Instruments Developer Network to provide customers with
JTAG and I2C solutions for DSPs and MCUs

Cerritos, CA, October 15, 2008 – As a new member of the Texas Instruments (TI) Developer Network, Corelis, Inc. today announced that its high-performance boundary-scan and JTAG functional emulation test tools can be used for TI’s digital signal processors (DSPs) and microcontrollers (MCU).

Power-aware test hot at ITC, as is analog test
Power-aware test will be the focus of a panel discussion and two technical paper sessions and is a key topic at this year’s International Test Conference, says Nur Touba, Professor, Department of Electrical and Computer Engineering, University of Texas at Austin, and Program Chair of this year’s ITC.

ASSET’s new Internet-based controller family enables world wide test…

Intellitech ships new multi-voltage JTAG multiplexer to compete with IEEE 1149.1 linking devices from Texas Instruments and National Semiconductor…

GOEPEL electronic exhibits revolutionary fusion of Debug/Emulation and JTAG/Boundary Scan Equipment at ESS…