Lauwereins, Rudy - Editor
Design, Automation, and Test in Europe: The Most Influential Papers of 10 Years of DATE
Springer- Feb, 2008 |

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Wang, Laung-Terng
System-on-Chip Test Architectures (Systems on Silicon)
Morgan Kaufmann- Nov, 2007 |

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Lombardi, Fabrizo
Design and Test of Digital Circuits by Quantum-Dot Cellular Automata
Artech House Publishers- Oct, 2007 |

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Sachdev, Manoj
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Springer- Jun, 2007 |

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Gizopoulos, Dimitris - Editor
Advances in Electronic Testing: Challenges and Methodologies
Springer- Nov, 2006 |

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Perelroyzen, Evgeni
Digital Integrated Circuits: Design-for-Test Using Simulink and StateflowCRC- Nov, 2006 |

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Huertas Sanchez, Gloria
Oscillation-Based Test in Mixed-Signal Circuits
Springer- Nov, 2006 |

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Reis, Ricardo - Editor
Design of Systems on a Chip: Design and Test
Springer- Oct, 2006 |

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Voldman, Steven Howard
ESD : RF Technology and Circuits
Wiley- Oct, 2006 |

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Friedman, Eby G.
Multi-voltage CMOS Circuit Design
John Wiley & Sons- Oct, 2006 |

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Waayers, Tom
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500
Springer- Jul, 2006 |

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Wen, Xiaoqing
VLSI Test Principles and Architectures: Design for Testability
Morgan Kaufmann- Jul, 2006 |

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Spanos, Costas J.
Fundamentals of Semiconductor Manufacturing and Process Control
Wiley-IEEE Press- May, 2006 |

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Voldman, Steven Howard
ESD: Circuits and Devices
John Wiley & Sons- Jan, 2006 |

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Peng Li, Mike
Design and Test for Multiple Gbps Communication Devices and Systems
International engineering consortium- Nov, 2005 |

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Larsson, Erik
Introduction to Advanced System-on-Chip Test Design and OptimizationSpringer- Nov, 2005 |

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Grout, Ian A.
Integrated Circuit Test Engineering: Modern Techniques
Springer- Oct, 2005 |

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Nightingale, Andy
Verification Methodology Manual for SystemVerilog
Springer- Sep, 2005 |

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Sonza Reorda, Matteo - Editor
System-level Test and Validation of Hardware/Software Systems
Springer- Apr, 2005 |

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Zorian, Yervant
Embedded Processor-Based Self-Test
Springer- Dec, 2004 |

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Huertas, Jose Luis - Editor
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Springer- Oct, 2004 |

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Kelly, Joe
Production Testing of RF and SOC Devices for Wireless Communications
Artech House Publishers- Apr, 2004 |

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Gupta, Sandeep
Testing of Digital Systems
Cambridge University Press- May, 2003 |

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Maxfield, Clive
Bebop to the Boolean Boogie
Newnes- Dec, 2002 |

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Leblebici, Yusuf
CMOS Digital Integrated Circuits Analysis & Design
McGraw-Hill Science/Engineering/Math- Oct, 2002 |

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Kapur, Rohit
CTL for Test Information of Digital ICs
Springer- Oct, 2002 |

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Chakrabarty, Krishnendu - Editor
SOC Testing for Plug and Play Test Automation
Springer- Sep, 2002 |

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Stroud, Charles E.
A Designer’s Guide to Built-in Self-Test
Springer- May, 2002 |

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Chakrabarty, Krishnendu
Test Resource Partitioning for System-on-a-Chip
Springer- May, 2002 |

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Scheiber, Stephen
Building a Successful Board-Test Strategy
Newnes- Oct, 2001 |

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Roberts, Gordon W.
An Introduction to Mixed-Signal IC Test and Measurement
Oxford University Press- Nov, 2000 |

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Agrawal, Vishwani D.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
Springer- Nov, 2000 |

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Zorian, Yervant
Principles of Testing Electronic Systems
Wiley-Interscience- Jan, 2000 |

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Nadeau-Dostie, Benoit - Editor
Design for AT-Speed Test, Diagnosis and Measurement
Springer- Sep, 1999 |

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Lala, Parag K.
Digital Circuit Testing and Testability
Academic Press- Jan, 1997 |

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Crouch, Alfred
Design-for-Test for Digital IC’s and Embedded Core Systems
Prentice Hall PTR- Jun, 1995 |

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Abramovici, Miron
Digital Systems Testing & Testable Design
Wiley-IEEE Press- Sep, 1994 |

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Abadir, Magdy - Editor
Economics of Electronic Design, Manufacture and Test
Springer- Sep, 1994 |

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Savir, Jacob
Built In Test for VLSI: Pseudorandom Techniques
Wiley-Interscience- Oct, 1987 |

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Mahoney, Matthew
DSP-Based Testing of Analog and Mixed-Signal Circuits
Wiley-IEEE Computer Society Pr- Apr, 1987 |

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February 16th, 2007 at 1:08 pm
Great idea! It may inspire me to create my own EDA engineer’s bookshelf.
June 25th, 2007 at 9:09 am
[...] Mr. Crouch also co-wrote chapter 6 of Advances in Electronic Testing: Challenges and Methodologies, which is a fairly new book, that I definitely have to get into my DFT Bookshelf. [...]
October 9th, 2007 at 7:50 pm
[...] a quick note to say that I added several new books to the DFT bookcase, which brings the number to over 40 - go have a look. There’s some interesting things in [...]