Here are a few books on IC design, design for test, and test! They are sorted by date, most recent first. To see the list sorted by author, go here… If you know of a book that should be on this list, email me at jford@dftdigest.com
Lauwereins, Rudy - Editor
Design, Automation, and Test in Europe: The Most Influential Papers of 10 Years of DATE
Springer- Feb, 2008 |
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Wang, Laung-Terng
System-on-Chip Test Architectures (Systems on Silicon)
Morgan Kaufmann- Nov, 2007 |
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Lombardi, Fabrizo
Design and Test of Digital Circuits by Quantum-Dot Cellular Automata
Artech House Publishers- Oct, 2007 |
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Sachdev, Manoj
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Springer- Jun, 2007 |
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Gizopoulos, Dimitris - Editor
Advances in Electronic Testing: Challenges and Methodologies
Springer- Nov, 2006 |
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Perelroyzen, Evgeni
Digital Integrated Circuits: Design-for-Test Using Simulink and Stateflow
CRC- Nov, 2006 |
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Huertas Sanchez, Gloria
Oscillation-Based Test in Mixed-Signal Circuits
Springer- Nov, 2006 |
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Reis, Ricardo - Editor
Design of Systems on a Chip: Design and Test
Springer- Oct, 2006 |
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Voldman, Steven Howard
ESD : RF Technology and Circuits
Wiley- Oct, 2006 |
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Friedman, Eby G.
Multi-voltage CMOS Circuit Design
John Wiley & Sons- Oct, 2006 |
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Waayers, Tom
The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500
Springer- Jul, 2006 |
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Wen, Xiaoqing
VLSI Test Principles and Architectures: Design for Testability
Morgan Kaufmann- Jul, 2006 |
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Spanos, Costas J.
Fundamentals of Semiconductor Manufacturing and Process Control
Wiley-IEEE Press- May, 2006 |
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Voldman, Steven Howard
ESD: Circuits and Devices
John Wiley & Sons- Jan, 2006 |
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Peng Li, Mike
Design and Test for Multiple Gbps Communication Devices and Systems
International engineering consortium- Nov, 2005 |
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Larsson, Erik
Introduction to Advanced System-on-Chip Test Design and Optimization
Springer- Nov, 2005 |
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Grout, Ian A.
Integrated Circuit Test Engineering: Modern Techniques
Springer- Oct, 2005 |
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Nightingale, Andy
Verification Methodology Manual for SystemVerilog
Springer- Sep, 2005 |
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Sonza Reorda, Matteo - Editor
System-level Test and Validation of Hardware/Software Systems
Springer- Apr, 2005 |
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Zorian, Yervant
Embedded Processor-Based Self-Test
Springer- Dec, 2004 |
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Huertas, Jose Luis - Editor
Test and Design-for-Testability in Mixed-Signal Integrated Circuits
Springer- Oct, 2004 |
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Kelly, Joe
Production Testing of RF and SOC Devices for Wireless Communications
Artech House Publishers- Apr, 2004 |
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Gupta, Sandeep
Testing of Digital Systems
Cambridge University Press- May, 2003 |
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Maxfield, Clive
Bebop to the Boolean Boogie
Newnes- Dec, 2002 |
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Leblebici, Yusuf
CMOS Digital Integrated Circuits Analysis & Design
McGraw-Hill Science/Engineering/Math- Oct, 2002 |
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Kapur, Rohit
CTL for Test Information of Digital ICs
Springer- Oct, 2002 |
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Chakrabarty, Krishnendu - Editor
SOC Testing for Plug and Play Test Automation
Springer- Sep, 2002 |
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Stroud, Charles E.
A Designer’s Guide to Built-in Self-Test
Springer- May, 2002 |
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Chakrabarty, Krishnendu
Test Resource Partitioning for System-on-a-Chip
Springer- May, 2002 |
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Scheiber, Stephen
Building a Successful Board-Test Strategy
Newnes- Oct, 2001 |
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Roberts, Gordon W.
An Introduction to Mixed-Signal IC Test and Measurement
Oxford University Press- Nov, 2000 |
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Agrawal, Vishwani D.
Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits
Springer- Nov, 2000 |
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Zorian, Yervant
Principles of Testing Electronic Systems
Wiley-Interscience- Jan, 2000 |
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Nadeau-Dostie, Benoit - Editor
Design for AT-Speed Test, Diagnosis and Measurement
Springer- Sep, 1999 |
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Lala, Parag K.
Digital Circuit Testing and Testability
Academic Press- Jan, 1997 |
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Crouch, Alfred
Design-for-Test for Digital IC’s and Embedded Core Systems
Prentice Hall PTR- Jun, 1995 |
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Abramovici, Miron
Digital Systems Testing & Testable Design
Wiley-IEEE Press- Sep, 1994 |
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Abadir, Magdy - Editor
Economics of Electronic Design, Manufacture and Test
Springer- Sep, 1994 |
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Savir, Jacob
Built In Test for VLSI: Pseudorandom Techniques
Wiley-Interscience- Oct, 1987 |
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Mahoney, Matthew
DSP-Based Testing of Analog and Mixed-Signal Circuits
Wiley-IEEE Computer Society Pr- Apr, 1987 |
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February 16th, 2007 at 1:08 pm
Great idea! It may inspire me to create my own EDA engineer’s bookshelf.
June 25th, 2007 at 9:09 am
[...] Mr. Crouch also co-wrote chapter 6 of Advances in Electronic Testing: Challenges and Methodologies, which is a fairly new book, that I definitely have to get into my DFT Bookshelf. [...]
October 9th, 2007 at 7:50 pm
[...] a quick note to say that I added several new books to the DFT bookcase, which brings the number to over 40 - go have a look. There’s some interesting things in [...]