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	<title>Comments on: Get to the core of the matter &#8211; how will you test that core?</title>
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	<description>Expanding design-for-test in an ever-shring world...</description>
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		<title>By: Stylianos Diamantidis</title>
		<link>http://www.dftdigest.com/feature/get-to-the-core-of-the-matter/comment-page-1/#comment-2594</link>
		<dc:creator>Stylianos Diamantidis</dc:creator>
		<pubDate>Tue, 04 Aug 2009 10:52:06 +0000</pubDate>
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		<description>Hi John,

You are very welcome. While there are certainly products that automate the creation of 1500-compliant infrastructures (e.g. Logicvision&#039;s), I have yet to see a generic, commercial, 1500 wrapping tool (there are, however, such tools/flows developed and used internally at several companies). Such a tool would need to be part of a greater, system-level, test reuse methodology. I think that SiP/die-stacking requires such a methodology and it will be a driver for more embedded test architecture tools.

Cheers,

-Stylianos.</description>
		<content:encoded><![CDATA[<p>Hi John,</p>
<p>You are very welcome. While there are certainly products that automate the creation of 1500-compliant infrastructures (e.g. Logicvision&#8217;s), I have yet to see a generic, commercial, 1500 wrapping tool (there are, however, such tools/flows developed and used internally at several companies). Such a tool would need to be part of a greater, system-level, test reuse methodology. I think that SiP/die-stacking requires such a methodology and it will be a driver for more embedded test architecture tools.</p>
<p>Cheers,</p>
<p>-Stylianos.</p>
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		<title>By: John</title>
		<link>http://www.dftdigest.com/feature/get-to-the-core-of-the-matter/comment-page-1/#comment-2577</link>
		<dc:creator>John</dc:creator>
		<pubDate>Sat, 01 Aug 2009 15:16:47 +0000</pubDate>
		<guid isPermaLink="false">http://www.dftdigest.com/?p=1109#comment-2577</guid>
		<description>Hi Stylianos!

Thanks for reading, and commenting!  Since you&#039;re involved in this area, what do you think about automating the *insertion* of this kind of wrapper, similar to some of the tools for 1149.1?  Will that come about anytime soon?

Cheers,
JMF</description>
		<content:encoded><![CDATA[<p>Hi Stylianos!</p>
<p>Thanks for reading, and commenting!  Since you&#8217;re involved in this area, what do you think about automating the *insertion* of this kind of wrapper, similar to some of the tools for 1149.1?  Will that come about anytime soon?</p>
<p>Cheers,<br />
JMF</p>
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	<item>
		<title>By: Stylianos Diamantidis</title>
		<link>http://www.dftdigest.com/feature/get-to-the-core-of-the-matter/comment-page-1/#comment-2576</link>
		<dc:creator>Stylianos Diamantidis</dc:creator>
		<pubDate>Sat, 01 Aug 2009 08:57:24 +0000</pubDate>
		<guid isPermaLink="false">http://www.dftdigest.com/?p=1109#comment-2576</guid>
		<description>John -- You did a great job of capturing one of the key challenges of implementing IEEE 1500 in your blog : verification! Your readers should know that the IEEE 1500 verification flow described in the ARM article is actually commercially available as an EDA tool-set by Globetech Solutions. As we demonstrated in the article, it effectively serves the purpose of &quot;verifying that the wrapper, control logic and CTL all match and comply with the 1500 and 1450.6 specs&quot;.</description>
		<content:encoded><![CDATA[<p>John &#8212; You did a great job of capturing one of the key challenges of implementing IEEE 1500 in your blog : verification! Your readers should know that the IEEE 1500 verification flow described in the ARM article is actually commercially available as an EDA tool-set by Globetech Solutions. As we demonstrated in the article, it effectively serves the purpose of &#8220;verifying that the wrapper, control logic and CTL all match and comply with the 1500 and 1450.6 specs&#8221;.</p>
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	<item>
		<title>By: Core Test Again&#8230; More in IEEE D&#38;T Magazine</title>
		<link>http://www.dftdigest.com/feature/get-to-the-core-of-the-matter/comment-page-1/#comment-2399</link>
		<dc:creator>Core Test Again&#8230; More in IEEE D&#38;T Magazine</dc:creator>
		<pubDate>Mon, 15 Jun 2009 04:34:28 +0000</pubDate>
		<guid isPermaLink="false">http://www.dftdigest.com/?p=1109#comment-2399</guid>
		<description>[...] special issue on IEEE Std 1500 and Its Usage &#8211; I blogged about the first part in February: Get to the core of the matter – how will you test that core?. I tacked the discussion in the magazine onto other discussion that had taken place in the LinkedIn [...]</description>
		<content:encoded><![CDATA[<p>[...] special issue on IEEE Std 1500 and Its Usage &#8211; I blogged about the first part in February: Get to the core of the matter – how will you test that core?. I tacked the discussion in the magazine onto other discussion that had taken place in the LinkedIn [...]</p>
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