DFT Digest

Power-aware test hot at ITC, as is analog test
Power-aware test will be the focus of a panel discussion and two technical paper sessions and is a key topic at this year’s International Test Conference, says Nur Touba, Professor, Department of Electrical and Computer Engineering, University of Texas at Austin, and Program Chair of this year’s ITC

XJTAG appoints FlowCAD in Germany
CAMBRIDGE, England, October 2, 2008 —XJTAG (www.xjtag.com), a leading global supplier of IEEE 1149.x JTAG-compliant boundary scan development systems, has appointed FlowCAD (www.flowcad.de) as its distributor for Germany, Austria, Switzerland and Liechtenstein.

Intellitech adds support for the Freescale DSP56F80X family’s on-chip programming and voltage measurement
Durham, NH – Business Wire – September 29th, 2008 – Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE 1149.1/JTAG, has announced that it has added support for the Freescale Semiconductor DSP56F80X family to its SystemBIST device, UltraTAP pod and PT100 concurrent testers used in volume manufacturing.

Corelis Offers Free JTAG/Boundary-Scan Training
Cerritos, CA, September 25, 2008 – Corelis announced today that there is now an expanded free three-day Boundary-Scan/JTAG training program at their company headquarters in Cerritos, California, for clients who require a comprehensive introduction and/or review of Boundary-Scan basics and hands-on experience generating and running tests.

Free boundary scan workshops at XJTAG
CAMBRIDGE, England, September 30, 2008 — XJTAG, a leading global supplier of IEEE Std. 1149.x boundary scan development systems, has scheduled a series of free ‘Introduction to boundary scan’ training workshops at its Cambridge headquarters.

New PXI Module enables Combination JTAG/Boundary Scan and dynamic Functional Test
Cambridge/Birmingham UK – At the Embedded Systems Show (ESS), GOEPEL electronic, world class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, launches a new series of JTAG Digital I/O PXI modules named PXI 5396-x.

Boundary Scan Software Platform SYSTEM CASCON™ automates complex Cluster Tests per IEEE1445 (DTIF)
GOEPEL electronic, world class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std 1149.x, introduces a new series of intelligent tools, particularly developed for the simulation based test of circuit functionalities, within the software platform SYSTEM CASCON™.