DFT Digest

January 29, 2007

The Inner and Outer Reaches of JTAG

Filed under: JTAG — John @ 7:49 pm

Today I received an e-mail from Dr. Ben Bennetts, DFT Consultant (Semi-retired) with a great introduction to some ‘in-the-works‘ extensions to the IEEE 1149.1 test access standard, called IJTAG (Internal JTAG) and SJTAG (System JTAG).

The Internal JTAG effort seeks to standardize the access to ‘internal instruments’ of all sorts that may reside on a single chip. IJTAG has been given permission to work on the standard by the IEEE as P1687.

The SJTAG effort deals with extending test access across several boards, perhaps joined through a backplane, and may include much more functionality than just board-level test, such as system-level configuration.

Much more detail is available in a PDF write-up titled IEEE Testability Standards: Recent Developments, graciously provided by Dr. Bennetts. Please take a look!

If you have questions, you may contact Dr. Bennetts directly, or just comment below, and we will pass it along…

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