Test-related? humor for your Monday blues…
About once a month, Mentor publishes a little piece on their website called Test Talk, written by Al Crouch. This month’s edition, entitled ‘Outsourcing, the Scrabble Method’, is a Dilbertian look at outsourcing, and of course, has its DFT-related tie-in: weighted fault coverage and n-detect. Hmmm… what could weighted fault coverage and outsourcing have in common?
Al Crouch is Chief Scientist and Director of DFT R&D at Inovys - and author of Design-for-Test for Digital IC’s and Embedded Core Systems, a great primer for DFT engineers. He’s also vice-chair of the P1687 (IJTAG) working group. Haven’t met him in person yet, but I know him by sight, and I’ve never seen him without a Hawiian shirt on - you know, perpetual casual Friday - I like his style…
Mr. Crouch also co-wrote chapter 6 of Advances in Electronic Testing: Challenges and Methodologies, which is a fairly new book, that I definitely have to get into my DFT Bookshelf.
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