VTS 2007 - May 6th in Berkely
And it’s May 7th - so I’m late. But not really, because all the action started today, beginning with a plenary session which includes a keynote address by Antun Domic of Synopsys, entitl;ed “New Role of Test in 45 Nanometer”, as well as one called “Roadmap of Design” by Gary Smith.
VLSI Test Symposium focuses on new test technology, and as such, consists of many papers that highlight exciting emerging techniques that you and I, as users of commercial tools, won’t be able to take advantage of right away. However, it is interesting content, and it’s comforting to know that our EDA companies are trying to look ahead to solve our test problems. We need that.
But that said, I should mention that there are some papers that detail methodologies that we can use right away, or will inspire us to do something different in our work, especially with regard to test techniques, outlier detection, and diagnosis.
VTS makes it’s older proceedings online (actually ony the abstracts - you have to pat for the full papers) at the VTS website, and the newer proceedings should be available for order soon (the link wasn’t worrking when I tried it).
I’ll be looking forward to seeing some of these papers. If you’re reading this, and you went to VTS, drop me a line and tell me what you thought was interesting!
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