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	Forum Announcements Forum Announcements from administrators and moderators Moderators: siyad, jford	5	5	Sat Dec 12, 2009 10:03 am jford
	Comments, Suggestions, Forum Requests Give us your ideas for improving DFT Forum! Moderators: siyad, jford	1	1	Sat Oct 13, 2007 5:47 pm siyad
DFT Topics
	Scan Design Scan cell design, Scan architecture, Scan chain configuration, Scan chain ordering/reordering, Full vs Partial scan Moderators: siyad, jford	29	94	Sun Dec 06, 2009 3:11 pm siyad
	ATPG and Fault Simulation ATPG algorithms, Fault simulation algorithms, fault models, fault classes, fault coverage Moderators: siyad, jford	48	143	Wed Jan 06, 2010 6:36 am srmprakash
	Test Compression Compression methods, test length reduction, test volume reduction, test compactors, X-tolerance Moderators: siyad, jford	10	60	Wed May 13, 2009 8:57 am srmprakash
	Transition and Delay Fault Transition fault, path delay fault, gate delay fault, small delay defects, robust vs non-robust vs hazard free tests, spot delay defects, process variations Moderators: siyad, jford	5	15	Tue Sep 22, 2009 7:32 am jford
	Memory/Array Test Memory test, Memory BIST, DRAM test, CAM test, BIST algorithms, Memory Faults, Redundancy and Repair Moderators: siyad, jford	9	33	Mon Nov 16, 2009 9:24 am Shruti
	Logic BIST LFSR/MISR/CA based, test length, pseudo-random, weighted random, aliasing Moderators: siyad, jford	7	25	Mon May 04, 2009 7:52 am siyad
	Core Test Core-based testing, IP testing, isolation ring, test protocols, IEEE 1500 Moderators: siyad, jford	3	22	Wed Dec 17, 2008 8:26 am srmprakash
	JTAG and Boundary Scan IEEE 1149.1, IEEE 1149.6, BSDL, SJTAG, iJTAG, cJTAG Moderators: siyad, jford	11	39	Sat Nov 14, 2009 8:07 am jford
	DFT Tools Commercial, Academic and Open Source Design-for-Test Tools	1	1	Mon Dec 15, 2008 6:19 am ConradNY
	Others Other DFT concepts/topics Moderators: siyad, jford	9	20	Thu Mar 12, 2009 9:18 am jford
Test Topics
	IC Manufacturing, Reliability & Quality DFM, yield prediction/enhancement, burn-in, Moderators: siyad, jford	2	7	Sun Jul 05, 2009 8:01 am jford
	Current Test IDDQ, IDDx, current measurement devices, on-chip current monitors, DFT for low power designs Moderators: siyad, jford	1	4	Mon Jul 06, 2009 8:21 am jford
	High Speed IO Test GHz/Gbps interface test, jitter and noise, eye diagram, source synchronous clocks, clock recovery, high speed instrumentation and measurement Moderators: siyad, jford	1	1	Sat Nov 14, 2009 7:55 am jford
	Analog / Mixed Signal Test Gain, linearity, distortion, etc. for amplifiers, filters, PLLs, VCOs, and more. Moderators: siyad, jford	1	1	Thu Nov 12, 2009 9:21 am jford
Miscellaneous
	Networking / DFT Job Hotline Post job openings and resumes here! Moderators: siyad, jford	2	4	Thu Oct 22, 2009 1:31 am rajeshshetty247
	DFT Humor and Facts Jokes, Riddles, Quizzes, Interesting facts, Interview questions, etc. Moderators: siyad, jford	1	1	Tue Mar 10, 2009 11:57 am sagar

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