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In a couple of previous posts, here, and here, I started discussing different design-for-test tools – you know, other than your run-of-the-mill ATPG and BIST tools. In the last post, I talked about a couple of tools that are targeted for the RTL domain. Now I’d like to mention some DFT-related products that [...]

If I may state the obvious, I am one guy, who has led one career, and therefore has a limited base of experience from which to draw. So when it comes to writing about Design-for-Test methodology and tools, those of you reading are getting a fairly narrow view of the wide world of DFT. [...]

… How about learning about ‘Cost Effective Test’?
If you hadn’t spotted it in the DFT Calendar, let me remind you that on 4/11 (just one short week away), Louis Ungar of A.T.E. Solutions will be giving a one-day seminar entitled, ‘Cost Effective Tests Using ATE, DFT and BIST’, in New York City, and there are [...]

Just a short note this afternoon, after 5 hours of trying to make head or tail of some pattern failures on the tester. The message is: DFT and design engineers, spend some time on the tester! It will open your eyes to the pain experienced by test engineers, caused by your lack of [...]

In today’s 65nm and beyond world, DFT’ers are stretching their wings and flying into the land of new technologies such as test compression, at-speed scan, and newer fault models such as bridging faults. And it’s completely necessary. But don’t forget that no matter how you plan to trap more and different types of [...]