DFT Digest

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Happy Sunday! Test week is over, participants are back to their normal lives, perhaps off to another conference. Last time I blogged, it was Monday, after the first panel and 40th year reception. I’m going to try to blog a few notes throughout this week, including some from conversations with folks from Cadence, Mentor and Synopsys.

Wow, it’s been so long since I done “in-the-news”, this might get to be a long post… the DFT world moves on whether I have time to document it or not!

The following are a selection of press releases from the first quarter of this year; I’ll follow up with more DFT in-the-news – beacause there is more to the industry than press releases!

Intellitech unveils low-power Bluetooth based IEEE 1149.1/JTAG Pod with non-volatile test and failure memory

Santa Clara, California – International Test Conference – October 30th, 2008 – Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE 1149.1/JTAG, has announced UltraTAP-BT, a Bluetooth enabled IEEE 1149.1/JTAG pod with non-volatile test program and failure memory.

Test Compression makes test vectors for efficient – I wish there was such a thing for schedules… ITC Day 2 for me seemed like a lot of running around, trying to find people, trying to avoid people [joking! really...], answering e-mails, phone calls, finding cell phone chargers… I missed a lot, but I suppose I was productive otherwise.

The most fun I had all day Wednesday was witnessing Panel 3 – Will Test Compression Run Out of Gas?

I suppose this little late-summer/early-autumn heat wave in SoCal makes one want to talk about heat. Makes sense to me – but what’s the excuse for these folks, presumably from the notably cooler Northern California? In the past few days, two different articles were published, one by Chris Allsup and Bill Lloyd of Synopsys, and the other from Anis Uzzaman, Patrick Gallagher, and Edward Malloy, all of Cadence. Both articles addressed the importance of closely considering and taking steps in attempting to put the cap on test-mode power consumption.