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Something interesting happened today. Well, interesting to me. After all, I’m a DFT guy. Anyway, I’m waiting for an ATPG run to crash (and I know it will crash, because I just threw the scripts together – it’s a Murphy’s Law thing, I’m sure). So what does the typically efficient person do when waiting in front of a computer? Right – I’m browsing the internet.

…let there be no doubt.

As a west coast USA native, like many Americans, I’m a little myopic – I admit it. But it’s never too late to change, right? Well, today, I confess to you all that I missed blogging about what appears to be a very interesting DFT/Test-related event that has just concluded: the seventeenth Asian Test Symposium. This was a 4-day event, in “snow[y] and cold” Sapporo, Japan.

Another October has come and gone, and those determined folks who do their best to ensure that only good electronic components and systems are shipped to customers will be making their way back to the home base. That’s it for the 2008 version of the International Test Conference. So what were the big ‘take-aways’ of this years conference?

Now let’s face it: Design for Manufacturing (DFM) is the hottest sector of the EDA industry. Everything else is, well, meh. From what I can gather, there are those who feel the sector of [...]

As I mentioned in my last post, I asked a few friends and acquaintances what they were looking forward to at ITC this year. My next respondent is Mohammad Tehranipoor of University of Connecticut.
Mohammad is, as he mentions below, the Program Chair of the workshop titled DBT: IEEE Workshop on Current- and Defect-Based [...]