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Power-aware test hot at ITC, as is analog test
Power-aware test will be the focus of a panel discussion and two technical paper sessions and is a key topic at this year’s International Test Conference, says Nur Touba, Professor, Department of Electrical and Computer Engineering, University of Texas at Austin, and Program Chair of this year’s ITC.

ASSET’s new Internet-based controller family enables world wide test…

Intellitech ships new multi-voltage JTAG multiplexer to compete with IEEE 1149.1 linking devices from Texas Instruments and National Semiconductor…

GOEPEL electronic exhibits revolutionary fusion of Debug/Emulation and JTAG/Boundary Scan Equipment at ESS…