Archive for IEEE 1149.1
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DFT in the 3rd dimension (or, “how do we go up from here?”)
Sometimes a post just begs to be written. Subconsciously, little reminders crop up in your input stream (a.k.a. eyes and ears) that prod you into doing something. Last week, like a Hitchcock blonde, it seemed like every time I turned around, something referring to 3-D technology popped out at me. I think it started when I began searching for material on JTAG implementations for MCMs…
DFT-in-the-News, 11/02/2008
Santa Clara, California – International Test Conference – October 30th, 2008 – Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE 1149.1/JTAG, has announced UltraTAP-BT, a Bluetooth enabled IEEE 1149.1/JTAG pod with non-volatile test program and failure memory.
