DFT Digest

You are browsing the archives of IEEE 1500.

Sometimes a post just begs to be written. Subconsciously, little reminders crop up in your input stream (a.k.a. eyes and ears) that prod you into doing something. Last week, like a Hitchcock blonde, it seemed like every time I turned around, something referring to 3-D technology popped out at me. I think it started when I began searching for material on JTAG implementations for MCMs…

Really, goodbye Summer – had enough of you. Sorry, I’m a spoiled Southern Californian: can’t stand the heat, or the cold. [I started this post over a week ago, when summer ended] Many people claim we have no seasons here in SoCal, but as a native, I feel them. Maybe it has to do with the cast of the sun, or maybe it’s just a combination of many different subtle cues (many colored trees, like those to the left are not really in the picture around here). Whatever it is, I look forward to the transition seasons, especially autumn.

I always look forward to getting my new IEEE Design & Test magazine. It seems to consistently contain great articles that bring out leading edge practices in IC design and test. And, refreshingly for me, mostly test. Design-for-test. Good stuff.

The May/June issue that just arrived in my mailbox this week did not disappoint – it was part 2 of the special issue on IEEE Std 1500 and Its Usage – I blogged about the first part in February: Get to the core of the matter – how will you test that core?.