DFT Digest

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Another October has come and gone, and those determined folks who do their best to ensure that only good electronic components and systems are shipped to customers will be making their way back to the home base. That’s it for the 2008 version of the International Test Conference. So what were the big ‘take-aways’ of this years conference?

Intellitech unveils low-power Bluetooth based IEEE 1149.1/JTAG Pod with non-volatile test and failure memory

Santa Clara, California – International Test Conference - October 30th, 2008 – Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE 1149.1/JTAG, has announced UltraTAP-BT, a Bluetooth enabled IEEE 1149.1/JTAG pod with non-volatile test program and failure memory.

I spent the morning taking advantage of proximity to vendors to solve a couple of problems, so the first presentation I saw today was the invited address given by AMD Fellow Jeff Rearick: This Is a Test: How to Tell if DFT and Test Are Adding Value to Your Company. I thought it was a very interesting address, so let’s see if I can relay some of what was said:

Test Compression makes test vectors for efficient - I wish there was such a thing for schedules… ITC Day 2 for me seemed like a lot of running around, trying to find people, trying to avoid people [joking! really...], answering e-mails, phone calls, finding cell phone chargers… I missed a lot, but I suppose I was productive otherwise.

The most fun I had all day Wednesday was witnessing Panel 3 - Will Test Compression Run Out of Gas?

It seemed like a long day - but it was actually shorter than most normal work days. But - some days at work, the most advanced DFT concept I utter is “no, the clocks need to be controlled from the primary I/O during scan shift…“. At the International Test Conference, the discourse runs a bit loftier. You gotta work harder to pay attention…