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Power-aware test hot at ITC, as is analog test
Power-aware test will be the focus of a panel discussion and two technical paper sessions and is a key topic at this year’s International Test Conference, says Nur Touba, Professor, Department of Electrical and Computer Engineering, University of Texas at Austin, and Program Chair of this year’s ITC.

A bit of catch-up here - a potpourri of news and press-releases from the last two weeks:

International Test Conference - The Cornerstone of Test Week(TM) - Hosts 39th Conference in Santa Clara, California, October 28 - 30, 2008

“International Test Conference, the highlight of the annual Test Week(TM) activities and the leading forum for electronics test technology, promises to engage and stimulate attendees from the test and design community with its technical program and activities when the doors open at the 39th annual ITC.”

Well, ITC was 2 weeks ago, but as a as a blogger, I’m still getting some mileage out of it. It took some time to get feedback from the various friends, and well, I have a day job that sometimes extends beyond daytime. Anyway, I’ve a feeling it’ll normal to write about ITC [...]

This is DFT Digest, so we talk about Design-for-Test a lot. Makes sense, right? But the International Test Conference is not just DFT, in fact it’s really mostly Test. As much as we DFTers [...]

The stream of ITC-related press releases has come and gone, and I do plan on discussing more of them, but in between, I’d like to continue to offer some observations of people who were there - something exclusive, that you won’t find anywhere else but DFT Digest.
One such person is Teresa McLaurin, DFT manager at [...]