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Another October has come and gone, and those determined folks who do their best to ensure that only good electronic components and systems are shipped to customers will be making their way back to the home base. That’s it for the 2008 version of the International Test Conference. So what were the big ‘take-aways’ of this years conference?

It’s not really the first day of the International Test Conference (tutorials started yesterday, and the actual conference kicks off tomorrow), but just to get *warmed up*, there was a special panel held to explore the *hot topic* of power-aware test: Power-aware DFT - Do we really need it?…

A week from today (Tuesday) the conference part of ITC Test Week starts. There are a lot of activities surrounding the whole event, and you can get a sense for whole deal if you peruse the ITC Advance Program. Since none of you readers offered up your to do lists for ITC next week, I guess it’s up to me - so without furthur ado, here are the Top 10 Things John Wants to Check Out at ITC 2008, Dave Letterman style…

I suppose this little late-summer/early-autumn heat wave in SoCal makes one want to talk about heat. Makes sense to me - but what’s the excuse for these folks, presumably from the notably cooler Northern California? In the past few days, two different articles were published, one by Chris Allsup and Bill Lloyd of Synopsys, and the other from Anis Uzzaman, Patrick Gallagher, and Edward Malloy, all of Cadence. Both articles addressed the importance of closely considering and taking steps in attempting to put the cap on test-mode power consumption.

Magma may have come up with the most unique announcement last month - ATPG that fits inextricably within the Talus implementation tool suite. Not to be outdone, Synopsys came out with a couple of their own.
First was the announcement of low power management for manufacturing test. This effort seems to [...]