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Let me hear you say yeah!

Karen Bartleson over at her blog, The Standards Game, issued an invitation to all who care*, to become a part of the balloting process for the IEEE P1450.6.1, “Standard for Describing On-Chip Scan Compression”, or Open Compression Interface. Karen has a short explanation of the idea behind the standard, and I’ve blogged about it here before. It was ratified by Accellera in October of 2006.

If you’ve ever been involved with device test or design for test, you’re very likely familiar with at least one of these acronyms - most probably WGL (Waveform Generation Language). If you’ve been in practice in the last 10 years, you’ve at least heard of STIL (Standard Test Interface Language).
How much do you know [...]

Today, Accellera has approved the Open Compression Interface standard (OCI version 1.0). See the EE Times article by Richard Goering here.
Back in Test Compression Series - Installment #2, I made brief mention of OCI, which is an effort that was undertaken by Accellera due to a need in the industry for flexibilty in test [...]