DFT Digest

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I spent the morning taking advantage of proximity to vendors to solve a couple of problems, so the first presentation I saw today was the invited address given by AMD Fellow Jeff Rearick: This Is a Test: How to Tell if DFT and Test Are Adding Value to Your Company. I thought it was a very interesting address, so let’s see if I can relay some of what was said:

Just a short note this afternoon, after 5 hours of trying to make head or tail of some pattern failures on the tester. The message is: DFT and design engineers, spend some time on the tester! It will open your eyes to the pain experienced by test engineers, caused by your lack of [...]

In today’s 65nm and beyond world, DFT’ers are stretching their wings and flying into the land of new technologies such as test compression, at-speed scan, and newer fault models such as bridging faults. And it’s completely necessary. But don’t forget that no matter how you plan to trap more and different types of [...]