DFT Digest

You are browsing the archives of Test.

Something interesting happened today. Well, interesting to me. After all, I’m a DFT guy. Anyway, I’m waiting for an ATPG run to crash (and I know it will crash, because I just threw the scripts together – it’s a Murphy’s Law thing, I’m sure). So what does the typically efficient person do when waiting in front of a computer? Right – I’m browsing the internet.

Dear reader: just think about how far test and design-for-test technology has come since you’ve been in the industry – even if only for a few years, new problems have arisen, and new techniques and tools have appeared to solve them (not all of them, but…).

This happens because a legion of engineers and researchers bring their expertise to bear on the problems, and in turn, contribute their solutions to the community.

Here we go again… just as the furor from Cadence’s failed takeover bid and its subsequent fallout finally starts to die down, Virage Logic decides to make public its desires for LogicVision! In a letter dated December 2nd, Virage offered LogicVision shareholders $1.05 per share (about $10 million in cash).

It’s a full month after DAC has come and gone, so it’s kind of ridiculous to continue.  But I’ve been busy, lazy, on vacation, unmotivated – you pick, what the heck. I think maybe I need to [...]

I sometimes wonder this.
It seems in the past several years, the design-for-test job has grown more complicated (as any other facet of the electronics design discipline), what with new (or more prominent) defect mechanisms and fault models, and new DFT methods and technologies to address them.
I was reading an interview at T&M World with Atun [...]