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DAtE – a very small ‘t’, if you read the trade press…
May I be the first to call for the removal of the ‘T’ in DATE (Design Automation & Test in Europe)? If you read the trade press, there was no Test there! DATE 2008 came and [...]
DATE 2008 – Starts Today!
Good day DFT folk – just a reminder, DATE 2008 started today. For those of you readers who are lucky enough to be in Munich this week for the event: What are you looking for? What sessions, and/or events do you have your eye on?
One person there this week is JL Gray of [...]
Test and Verification: Quid Pro Quo
I was reading Peggy Aycinena’s DVCON post at EDACafe this past week, and ran across a couple of thought provoking (at least for me) paragraphs. Ms. Aycinena was describing the Wednesday keynote speech given by Wally Rhines [...]
DFM/DFY/DFT – The key to future profitability in the chip business
Now let’s face it: Design for Manufacturing (DFM) is the hottest sector of the EDA industry. Everything else is, well, meh. From what I can gather, there are those who feel the sector of [...]
Testability Management Gets a Group
An ‘advisory’ group that is… somehow DFT religion must be brought to upper management.
Introducing the Testability Management Advisory Group (TMAG), “a grass roots organization made up of test professionals who believe that success for Testability in general, and Design for Testability (DFT) in particular, requires the involvement of management at all levels.”
The first official [...]
