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ITC: Test is getting harder, conferences getting smaller…

Happy Sunday! Test week is over, participants are back to their normal lives, perhaps off to another conference. Last time I blogged, it was Monday, after the first panel and 40th year reception. I’m going to try to blog a few notes throughout this week, including some from conversations with folks from Cadence, Mentor and Synopsys.

DFT-in-the-news: 4/05/2009

Wow, it’s been so long since I done “in-the-news”, this might get to be a long post… the DFT world moves on whether I have time to document it or not!

The following are a selection of press releases from the first quarter of this year; I’ll follow up with more DFT in-the-news – beacause there is more to the industry than press releases!

DFT in-the-news, 10/14/2008

Power-aware test hot at ITC, as is analog test
Power-aware test will be the focus of a panel discussion and two technical paper sessions and is a key topic at this year’s International Test Conference, says Nur Touba, Professor, Department of Electrical and Computer Engineering, University of Texas at Austin, and Program Chair of this year’s ITC.