DFT Digest

The mission of this website is to educate and discuss electronics design for test. At the end of the day, I want to help anyone trying to tackle the DFT problem, including myself, get through their day. What are we trying to solve? What tools are available to help us solve those problems? How do we know when the design-for-test job is done?

These are the questions I’d like to address in a series of posts (I’ll call it the basics series), which will go on for some time. I will stray into more advanced topics on a regular basis, but, I will advance the basics series just as regularly.

Topics include all those you see on the right side of this web page, in the ‘Categories’ section: scan, ATPG, BIST, JTAG, and any number of other acronyms
Of course, I should repeat often, that I would like feedback, in the form of corrections, criticisms and additional information as often as you readers can find a few spare moments of your busy day.

So please, visit often, and contribute when you can!