DFT Digest

It’s been a long time (2 weeks) since my last post; I’ve been enjoying my holiday, thank you very much. I hope you all have too!

It’s actually exactly 1 year since my first post, even though I didn’t get real active until August or so, and didn’t start really telling anyone about the blog until around ITC time. I hope to keep up the momentum in this new year, and spread the word to encourage participation. There’s a lot of good that can come from communicating with one’s colleagues. Right?

Last year, among other things, I did one semi-complete series on test compression, and then started a thread on developing a DFT plan, which I’d like to pursue in the coming weeks. I tried last year to keep on top of industry news items, and I’ll try to keep that up also. I’d like to work up a DFT calendar, similar to the IEEE Test Technology Technical Council (TTTC) calendar that is sent to members. We’ll see.

Look also for extended series on other subjects such as JTAG, ATPG and BIST technologies. I’m very interested in all of them, and the more I write about them, the more I learn!

So many resolutions, so little time..

And I can’t stress enough how important it is to have community participation - please take time to register (it’s FREE) and comment on the posts! Add your two cents to what I hope is an easily accessed base of knowledge for the everyday practice of design for test.

Have a wonderful 2007!